Volume No. 10 Issue No.: 2 Page No.: 298-303 October-December 2015

 

TRACE ELEMENTAL ANALYSIS OF SOIL SAMPLES USING PARTICLE INDUCED X-RAY EMISSION TECHNIQUE

 

Kumar M. R., Sarita P., Naga Raju G. J. and Reddy S. B.

1. Department of Physics, GIT, GITAM University, Visakhapatnam, Andhra Pradesh (INDIA) 2. Department of Physics, UCEV, JNTUK, Vizianagraram, Andhra Pradesh (INDIA) 3. Swami Jnanananda Laboratories for Nuclear Research, Andhra University, Visakhapatnam, Andhra Pradesh (INDIA)

 

Received on : July 10, 2015

 

ABSTRACT

 

Trace elemental analysis was carried out in the soil samples collected from in and around Visakhapatnam using Particle Induced X-ray Emission technique (PIXE). PIXE is a powerful tool for the study of environmental pollution because it is non-destructive and provides quantitative information on nearly all trace elements. A 2MeV proton beam was used to excite the samples. The present experiments were carried out using 3MV tandem pelletron accelerator at Institute of Physics, Bhubaneswar, India. The elements Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Br, Rb, Sr and Pb were identified and their relative concentrations were determined. The high levels of some elements observed in the study areas when compared to the control area is attributed to automotive exhaust and industries in the vicinity.

 

Keywords : PIXE, Trace elements, Soil pollution, Automobile exhaust, Environmental pollution

 

 

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